TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_59_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-014-10 | FUSED_ID : 6359364768391786730
  IC_TEMP :  -59.45 | VDDM : 1123.42 | AUX_INT :   -8.67 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15254e-03 / 2
  ADC_P0  : -8.67333e-03 ± 2.29510e-02
  ADC_P1  : 8.41234e-03 ± 5.56572e-04
  ADC_P2  : -6.34462e-06 ± 2.67656e-06
  CSA_Chi2/NDF : 1.57286e-04 / 2
  CSA_P0  : 5.91037e-02 ± 8.36503e-03
  CSA_P1  : 1.01123e-02 ± 6.30245e-04
  CSA_P2  : -5.27312e-05 ± 9.59788e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 20, 34, 43, 64, 83, 84, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 16, 34, 47, 60, 89, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3705', '1.800', '0.1248', '1.799', '0.0937', '7.000', '0.7075', 1, 1, 1, 1, 1725292792.555705]
VI_after__Init : ['1.201', '0.3709', '1.800', '0.1249', '1.800', '0.0870', '7.000', '0.7069', 1, 1, 1, 1, 1725292800.642031]
VI_at__the_End : ['1.201', '0.4806', '1.800', '0.1364', '1.805', '0.1160', '7.000', '0.7076', 1, 1, 1, 1, 1725292868.4820511]