TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_58_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-015-10 | FUSED_ID : 6359364768391786746
  IC_TEMP :  -58.45 | VDDM : 1121.24 | AUX_INT :   -9.84 | CsaBias :   76.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63486e-03 / 2
  ADC_P0  : -9.83610e-03 ± 2.74154e-02
  ADC_P1  : 8.67231e-03 ± 6.89458e-04
  ADC_P2  : -6.33706e-06 ± 3.45109e-06
  CSA_Chi2/NDF : 1.59653e-04 / 2
  CSA_P0  : 5.87556e-02 ± 8.42773e-03
  CSA_P1  : 9.98775e-03 ± 6.34969e-04
  CSA_P2  : -5.10302e-05 ± 9.66982e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [46, 81, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 78, 88, 100, 101, 111, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2093', '1.800', '0.1750', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1725292696.0909202]
VI_after__Init : ['1.201', '0.2095', '1.800', '0.1750', '1.799', '0.0844', '7.000', '0.7065', 1, 1, 1, 1, 1725292704.1934185]
VI_at__the_End : ['1.201', '0.4810', '1.800', '0.1372', '1.802', '0.1165', '7.000', '0.7075', 1, 1, 1, 1, 1725292772.452283]