TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_56_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-016-13 | FUSED_ID : 6359364768391786765
  IC_TEMP :  -59.30 | VDDM : 1107.88 | AUX_INT :   -9.26 | CsaBias :   71.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47721e-03 / 2
  ADC_P0  : -9.26231e-03 ± 2.60300e-02
  ADC_P1  : 8.98885e-03 ± 6.74793e-04
  ADC_P2  : -7.20892e-06 ± 3.46850e-06
  CSA_Chi2/NDF : 1.36857e-04 / 2
  CSA_P0  : 6.06009e-02 ± 7.80290e-03
  CSA_P1  : 9.75253e-03 ± 5.87892e-04
  CSA_P2  : -4.80413e-05 ± 8.95290e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [24, 25, 42, 57, 60, 64, 72, 82, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 16, 17, 85, 93, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2181', '1.800', '0.1884', '1.800', '0.0892', '7.000', '0.7069', 1, 1, 1, 1, 1725292598.8962927]
VI_after__Init : ['1.201', '0.2183', '1.800', '0.1884', '1.800', '0.0837', '7.000', '0.7069', 1, 1, 1, 1, 1725292606.9356747]
VI_at__the_End : ['1.201', '0.4782', '1.800', '0.1386', '1.800', '0.1161', '7.000', '0.7074', 1, 1, 1, 1, 1725292666.2453163]