TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_55_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-017-13 | FUSED_ID : 6359364768391786781
  IC_TEMP :  -58.31 | VDDM : 1110.89 | AUX_INT :   -5.88 | CsaBias :   63.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.67834e-04 / 2
  ADC_P0  : -5.88140e-03 ± 1.74738e-02
  ADC_P1  : 8.66644e-03 ± 4.50682e-04
  ADC_P2  : -5.99192e-06 ± 2.29419e-06
  CSA_Chi2/NDF : 1.49610e-04 / 2
  CSA_P0  : 5.96471e-02 ± 8.15836e-03
  CSA_P1  : 1.02175e-02 ± 6.14674e-04
  CSA_P2  : -5.30936e-05 ± 9.36075e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [23, 58, 114, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 17]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4803', '1.800', '0.1655', '1.800', '0.0957', '7.000', '0.7066', 1, 1, 1, 1, 1725292501.7546542]
VI_after__Init : ['1.201', '0.4813', '1.800', '0.1656', '1.800', '0.0900', '7.000', '0.7068', 1, 1, 1, 1, 1725292509.8529649]
VI_at__the_End : ['1.201', '0.4883', '1.800', '0.1391', '1.799', '0.1149', '7.000', '0.7075', 1, 1, 1, 1, 1725292578.2098713]