TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_48_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-021-13 | FUSED_ID : 6359364768391786845
  IC_TEMP :  -56.16 | VDDM : 1136.67 | AUX_INT :   -5.27 | CsaBias :   68.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.27739e-04 / 2
  ADC_P0  : -5.27408e-03 ± 1.82854e-02
  ADC_P1  : 8.28115e-03 ± 4.61114e-04
  ADC_P2  : -4.75908e-06 ± 2.29478e-06
  CSA_Chi2/NDF : 1.16301e-04 / 2
  CSA_P0  : 5.94698e-02 ± 7.19306e-03
  CSA_P1  : 9.78799e-03 ± 5.41945e-04
  CSA_P2  : -4.63312e-05 ± 8.25319e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [26, 38]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [15, 24, 47, 82, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2536', '1.800', '0.1616', '1.799', '0.0917', '7.000', '0.7069', 1, 1, 1, 1, 1725292116.4334035]
VI_after__Init : ['1.201', '0.2537', '1.800', '0.1616', '1.800', '0.0859', '7.000', '0.7069', 1, 1, 1, 1, 1725292125.272782]
VI_at__the_End : ['1.201', '0.4884', '1.800', '0.1380', '1.800', '0.1131', '7.000', '0.7076', 1, 1, 1, 1, 1725292192.19881]