TEST_NAME : Wafer
TEST_DATE : 24_09_02-17_45_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-007-023-13 | FUSED_ID : 6359364768391786877
  IC_TEMP :  -53.22 | VDDM : 1124.43 | AUX_INT :   -9.59 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76766e-03 / 2
  ADC_P0  : -9.59254e-03 ± 2.85612e-02
  ADC_P1  : 8.49755e-03 ± 7.13619e-04
  ADC_P2  : -5.64329e-06 ± 3.54948e-06
  CSA_Chi2/NDF : 1.35159e-04 / 2
  CSA_P0  : 5.87965e-02 ± 7.75433e-03
  CSA_P1  : 9.67344e-03 ± 5.84233e-04
  CSA_P2  : -4.56586e-05 ± 8.89717e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [27, 40, 63, 65, 83, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [19, 70, 89, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3246', '1.800', '0.1437', '1.799', '0.0898', '7.000', '0.7070', 1, 1, 1, 1, 1725291924.652594]
VI_after__Init : ['1.201', '0.3246', '1.800', '0.1437', '1.800', '0.0846', '7.000', '0.7070', 1, 1, 1, 1, 1725291932.6910584]
VI_at__the_End : ['1.201', '0.4848', '1.800', '0.1364', '1.799', '0.1129', '7.000', '0.7077', 1, 1, 1, 1, 1725291993.419538]