TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_19_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-002-14 | FUSED_ID : 6359364768391790638
  IC_TEMP :  -61.65 | VDDM : 1125.86 | AUX_INT :  -10.43 | CsaBias :   59.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58823e-03 / 2
  ADC_P0  : -1.04302e-02 ± 2.69862e-02
  ADC_P1  : 8.82795e-03 ± 6.87589e-04
  ADC_P2  : -6.50748e-06 ± 3.50390e-06
  CSA_Chi2/NDF : 1.73311e-04 / 2
  CSA_P0  : 5.99090e-02 ± 8.78082e-03
  CSA_P1  : 1.00515e-02 ± 6.61571e-04
  CSA_P2  : -5.23271e-05 ± 1.00749e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 40, 84, 91, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 9, 14, 81, 103, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3648', '1.800', '0.1585', '1.799', '0.0971', '7.000', '0.7076', 1, 1, 1, 1, 1725293948.410196]
VI_after__Init : ['1.201', '0.3652', '1.800', '0.1587', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1725293957.3225267]
VI_at__the_End : ['1.201', '0.4836', '1.800', '0.1401', '1.804', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1725294023.7103102]