TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_22_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-004-14 | FUSED_ID : 6359364768391790670
  IC_TEMP :  -55.13 | VDDM : 1125.73 | AUX_INT :   -8.08 | CsaBias :   73.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17911e-03 / 2
  ADC_P0  : -8.07604e-03 ± 2.32833e-02
  ADC_P1  : 8.19480e-03 ± 5.65933e-04
  ADC_P2  : -5.12639e-06 ± 2.73263e-06
  CSA_Chi2/NDF : 1.49156e-04 / 2
  CSA_P0  : 5.83859e-02 ± 8.14598e-03
  CSA_P1  : 9.81528e-03 ± 6.13741e-04
  CSA_P2  : -4.68502e-05 ± 9.34654e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [3, 11, 35, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 3, 7, 27, 30, 46, 58, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2883', '1.800', '0.1173', '1.800', '0.0873', '7.000', '0.7076', 1, 1, 1, 1, 1725294141.4510505]
VI_after__Init : ['1.201', '0.2883', '1.800', '0.1173', '1.800', '0.0815', '7.000', '0.7077', 1, 1, 1, 1, 1725294149.6923966]
VI_at__the_End : ['1.194', '0.4840', '1.800', '0.1366', '1.804', '0.1146', '7.000', '0.7085', 1, 1, 1, 1, 1725294216.0122507]