TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_27_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-007-14 | FUSED_ID : 6359364768391790718
  IC_TEMP :  -58.31 | VDDM : 1126.58 | AUX_INT :   -8.39 | CsaBias :   66.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.25572e-04 / 2
  CSA_P0  : 6.02652e-02 ± 7.47428e-03
  CSA_P1  : 9.86306e-03 ± 5.63133e-04
  CSA_P2  : -4.78686e-05 ± 8.57585e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [27, 28, 29, 48, 64, 68, 70, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 16, 17, 19, 40, 64]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3351', '1.800', '0.1517', '1.800', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1725294430.7034159]
VI_after__Init : ['1.201', '0.3351', '1.800', '0.1517', '1.800', '0.0885', '7.000', '0.7075', 1, 1, 1, 1, 1725294438.723783]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1399', '1.807', '0.1144', '7.000', '0.7086', 1, 1, 1, 1, 1725294497.9771316]