TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_28_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-008-14 | FUSED_ID : 6359364768391790734
  IC_TEMP :  -47.89 | VDDM : 1118.13 | AUX_INT :  -81.26 | CsaBias :   19.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17629e-03 / 2
  ADC_P0  : -8.12576e-02 ± 2.69361e-02
  ADC_P1  : 9.26277e-03 ± 6.39832e-04
  ADC_P2  : -8.74045e-06 ± 2.98627e-06
  CSA_Chi2/NDF : 1.11747e-04 / 2
  CSA_P0  : 5.94180e-02 ± 7.05082e-03
  CSA_P1  : 9.62265e-03 ± 5.31228e-04
  CSA_P2  : -4.30149e-05 ± 8.08998e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [4, 10, 60, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 25, 45, 59, 92, 93, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1281', '1.800', '0.1661', '1.800', '0.0811', '7.000', '0.7083', 1, 1, 1, 1, 1725294527.1148772]
VI_after__Init : ['1.201', '0.1280', '1.800', '0.1661', '1.800', '0.0736', '7.000', '0.7076', 1, 1, 1, 1, 1725294535.2692924]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1372', '1.799', '0.1103', '7.000', '0.7082', 1, 1, 1, 1, 1725294602.3250155]