TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_38_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-014-14 | FUSED_ID : 6359364768391790830
  IC_TEMP :  -56.52 | VDDM : 1135.51 | AUX_INT :   -8.14 | CsaBias :   75.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22598e-03 / 2
  ADC_P0  : -8.13659e-03 ± 2.36531e-02
  ADC_P1  : 8.45342e-03 ± 5.70520e-04
  ADC_P2  : -6.66989e-06 ± 2.73086e-06
  CSA_Chi2/NDF : 1.10827e-04 / 2
  CSA_P0  : 5.90347e-02 ± 7.02173e-03
  CSA_P1  : 9.60917e-03 ± 5.29037e-04
  CSA_P2  : -4.47944e-05 ± 8.05661e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [11, 27, 31, 44, 59, 61, 69, 79, 86, 112, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 2, 20, 48]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1743', '1.800', '0.1479', '1.799', '0.0875', '7.000', '0.7072', 1, 1, 1, 1, 1725295104.5116854]
VI_after__Init : ['1.202', '0.1744', '1.800', '0.1480', '1.799', '0.0821', '7.000', '0.7070', 1, 1, 1, 1, 1725295113.3660698]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1357', '1.803', '0.1125', '7.000', '0.7081', 1, 1, 1, 1, 1725295179.9504607]