TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_40_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-015-14 | FUSED_ID : 6359364768391790846
  IC_TEMP :  -53.14 | VDDM : 1127.32 | AUX_INT :   -6.69 | CsaBias :   67.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.13490e-04 / 2
  ADC_P0  : -6.68986e-03 ± 1.92966e-02
  ADC_P1  : 8.24604e-03 ± 4.71431e-04
  ADC_P2  : -5.45250e-06 ± 2.27779e-06
  CSA_Chi2/NDF : 1.13916e-04 / 2
  CSA_P0  : 5.85884e-02 ± 7.11892e-03
  CSA_P1  : 9.78219e-03 ± 5.36359e-04
  CSA_P2  : -4.60095e-05 ± 8.16811e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [15, 48, 56, 57, 63, 72, 104, 112, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [0, 34, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2478', '1.800', '0.1756', '1.800', '0.0885', '7.000', '0.7068', 1, 1, 1, 1, 1725295200.9641116]
VI_after__Init : ['1.202', '0.2477', '1.800', '0.1756', '1.800', '0.0828', '7.000', '0.7070', 1, 1, 1, 1, 1725295209.1185505]
VI_at__the_End : ['1.202', '0.4890', '1.800', '0.1366', '1.804', '0.1132', '7.000', '0.7075', 1, 1, 1, 1, 1725295276.0179303]