TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_43_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-017-09 | FUSED_ID : 6359364768391790873
  IC_TEMP :  -57.93 | VDDM : 1133.31 | AUX_INT :   -6.44 | CsaBias :   63.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.42629e-04 / 2
  ADC_P0  : -6.44307e-03 ± 1.84054e-02
  ADC_P1  : 8.73785e-03 ± 4.70425e-04
  ADC_P2  : -6.69681e-06 ± 2.36935e-06
  CSA_Chi2/NDF : 1.37956e-04 / 2
  CSA_P0  : 5.89845e-02 ± 7.83415e-03
  CSA_P1  : 1.02378e-02 ± 5.90247e-04
  CSA_P2  : -5.30956e-05 ± 8.98876e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [21, 26, 77, 91, 101, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [8, 26, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1962', '1.800', '0.1858', '1.800', '0.0921', '7.000', '0.7070', 1, 1, 1, 1, 1725295393.085578]
VI_after__Init : ['1.202', '0.1963', '1.800', '0.1857', '1.800', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1725295401.2100213]
VI_at__the_End : ['1.200', '0.4917', '1.800', '0.1419', '1.799', '0.1146', '7.000', '0.7076', 1, 1, 1, 1, 1725295467.997226]