TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_49_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-021-09 | FUSED_ID : 6359364768391790937
  IC_TEMP :  -49.40 | VDDM : 1124.07 | AUX_INT :  -27.96 | CsaBias :   57.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96898e-03 / 2
  ADC_P0  : -2.79604e-02 ± 3.12008e-02
  ADC_P1  : 8.64388e-03 ± 7.55290e-04
  ADC_P2  : -6.71891e-06 ± 3.63161e-06
  CSA_Chi2/NDF : 1.35141e-04 / 2
  CSA_P0  : 6.03486e-02 ± 7.75382e-03
  CSA_P1  : 1.01368e-02 ± 5.84195e-04
  CSA_P2  : -4.84441e-05 ± 8.89659e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [8, 17, 39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [43, 51, 58, 116, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1977', '1.800', '0.1505', '1.800', '0.0883', '7.000', '0.7069', 1, 1, 1, 1, 1725295776.4388585]
VI_after__Init : ['1.201', '0.1978', '1.800', '0.1505', '1.800', '0.0826', '7.000', '0.7068', 1, 1, 1, 1, 1725295785.2043324]
VI_at__the_End : ['1.201', '0.5026', '1.800', '0.1368', '1.804', '0.1124', '7.000', '0.7074', 1, 1, 1, 1, 1725295844.8199012]