TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_54_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-024-09 | FUSED_ID : 6359364768391790985
  IC_TEMP :  -52.39 | VDDM : 1125.46 | AUX_INT :   -8.12 | CsaBias :   83.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 8.38344e-05 / 2
  CSA_P0  : 5.92563e-02 ± 6.10708e-03
  CSA_P1  : 9.12493e-03 ± 4.60124e-04
  CSA_P2  : -3.60843e-05 ± 7.00715e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [32, 34, 46, 68, 71, 78, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [28, 46, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1859', '1.800', '0.1806', '1.799', '0.0852', '7.000', '0.7067', 1, 1, 1, 1, 1725296065.6985729]
VI_after__Init : ['1.201', '0.1859', '1.800', '0.1805', '1.800', '0.0799', '7.000', '0.7068', 1, 1, 1, 1, 1725296073.7739987]
VI_at__the_End : ['1.201', '0.4876', '1.800', '0.1345', '1.803', '0.1104', '7.000', '0.7075', 1, 1, 1, 1, 1725296140.8819401]