TEST_NAME : Wafer
TEST_DATE : 24_09_02-18_56_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-008-025-09 | FUSED_ID : 6359364768391791001
  IC_TEMP :  -61.46 | VDDM : 1121.34 | AUX_INT :   -7.99 | CsaBias :   62.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00340e-03 / 2
  ADC_P0  : -7.98888e-03 ± 2.14014e-02
  ADC_P1  : 8.85632e-03 ± 5.47675e-04
  ADC_P2  : -7.03999e-06 ± 2.77426e-06
  CSA_Chi2/NDF : 2.21475e-04 / 2
  CSA_P0  : 5.81682e-02 ± 9.92624e-03
  CSA_P1  : 1.00114e-02 ± 7.47871e-04
  CSA_P2  : -5.19201e-05 ± 1.13892e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [14, 50, 57, 63, 64, 92, 102, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 16, 18, 20, 41, 56, 91, 103, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3409', '1.800', '0.1290', '1.800', '0.0911', '7.000', '0.7068', 1, 1, 1, 1, 1725296162.3074236]
VI_after__Init : ['1.202', '0.3404', '1.800', '0.1291', '1.800', '0.0852', '7.000', '0.7068', 1, 1, 1, 1, 1725296170.3508162]
VI_at__the_End : ['1.201', '0.4776', '1.800', '0.1375', '1.804', '0.1136', '7.000', '0.7076', 1, 1, 1, 1, 1725296236.913863]