TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_23_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-009-013-03 | FUSED_ID : 6359364768391794899
  IC_TEMP :  -50.92 | VDDM : 1121.60 | AUX_INT :   -6.90 | CsaBias :   81.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04346e-03 / 2
  ADC_P0  : -6.90410e-03 ± 2.19353e-02
  ADC_P1  : 8.09328e-03 ± 5.38919e-04
  ADC_P2  : -4.40081e-06 ± 2.62625e-06
  CSA_Chi2/NDF : 1.31212e-04 / 2
  CSA_P0  : 5.94521e-02 ± 7.64028e-03
  CSA_P1  : 9.93827e-03 ± 5.75640e-04
  CSA_P2  : -4.72456e-05 ± 8.76632e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [35, 43, 47, 49, 77, 79, 97, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2260', '1.800', '0.1117', '1.800', '0.0838', '7.000', '0.7076', 1, 1, 1, 1, 1725297797.598881]
VI_after__Init : ['1.201', '0.2259', '1.800', '0.1117', '1.800', '0.0785', '7.000', '0.7079', 1, 1, 1, 1, 1725297805.6422987]
VI_at__the_End : ['1.201', '0.4959', '1.800', '0.1370', '1.800', '0.1112', '7.000', '0.7083', 1, 1, 1, 1, 1725297874.3669326]