TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_04_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-009-025-04 | FUSED_ID : 6359364768391795092
  IC_TEMP :  -50.65 | VDDM : 1122.19 | AUX_INT :  -36.92 | CsaBias :   51.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75843e-03 / 2
  ADC_P0  : -3.69217e-02 ± 3.00585e-02
  ADC_P1  : 8.94273e-03 ± 7.44621e-04
  ADC_P2  : -7.19460e-06 ± 3.65855e-06
  CSA_Chi2/NDF : 1.23539e-04 / 2
  CSA_P0  : 5.88954e-02 ± 7.41350e-03
  CSA_P1  : 1.00389e-02 ± 5.58554e-04
  CSA_P2  : -4.74069e-05 ± 8.50612e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 24, 78, 103, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [10, 17, 30, 54, 91, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2768', '1.800', '0.1563', '1.800', '0.0872', '7.000', '0.7071', 1, 1, 1, 1, 1725296642.5574965]
VI_after__Init : ['1.201', '0.2768', '1.800', '0.1563', '1.800', '0.0814', '7.000', '0.7070', 1, 1, 1, 1, 1725296651.349754]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1392', '1.804', '0.1124', '7.000', '0.7079', 1, 1, 1, 1, 1725296716.154929]