TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_02_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-009-026-04 | FUSED_ID : 6359364768391795108
  IC_TEMP :  -56.05 | VDDM : 1124.99 | AUX_INT :   -7.98 | CsaBias :   68.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10091e-03 / 2
  ADC_P0  : -7.97799e-03 ± 2.24556e-02
  ADC_P1  : 8.52167e-03 ± 5.58944e-04
  ADC_P2  : -6.16032e-06 ± 2.75572e-06
  CSA_Chi2/NDF : 1.43395e-04 / 2
  CSA_P0  : 5.81320e-02 ± 7.98711e-03
  CSA_P1  : 9.81324e-03 ± 6.01771e-04
  CSA_P2  : -4.55667e-05 ± 9.16426e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 46, 69, 76, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 13, 21, 36, 84, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1813', '1.800', '0.1560', '1.800', '0.0858', '7.000', '0.7067', 1, 1, 1, 1, 1725296546.828706]
VI_after__Init : ['1.201', '0.1814', '1.800', '0.1559', '1.802', '0.0800', '7.000', '0.7067', 1, 1, 1, 1, 1725296554.947079]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1345', '1.800', '0.1122', '7.000', '0.7077', 1, 1, 1, 1, 1725296621.214067]