TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_49_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-006-13 | FUSED_ID : 6359364768391798893
  IC_TEMP :  -56.55 | VDDM : 1130.43 | AUX_INT :   -7.52 | CsaBias :   76.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01293e-03 / 2
  ADC_P0  : -7.52358e-03 ± 2.15630e-02
  ADC_P1  : 8.45699e-03 ± 5.41492e-04
  ADC_P2  : -5.50143e-06 ± 2.69770e-06
  CSA_Chi2/NDF : 1.68841e-04 / 2
  CSA_P0  : 5.88231e-02 ± 8.66685e-03
  CSA_P1  : 1.02688e-02 ± 6.52984e-04
  CSA_P2  : -5.34025e-05 ± 9.94418e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 13, 48, 52, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [30, 57, 71, 84, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4256', '1.800', '0.1439', '1.800', '0.1003', '7.000', '0.7065', 1, 1, 1, 1, 1725299341.7437553]
VI_after__Init : ['1.201', '0.4259', '1.800', '0.1440', '1.800', '0.0945', '7.000', '0.7067', 1, 1, 1, 1, 1725299349.8950586]
VI_at__the_End : ['1.201', '0.4916', '1.800', '0.1412', '1.799', '0.1144', '7.000', '0.7075', 1, 1, 1, 1, 1725299417.302625]