TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_50_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-007-13 | FUSED_ID : 6359364768391798909
  IC_TEMP :  -55.82 | VDDM : 1124.39 | AUX_INT :   -7.96 | CsaBias :   68.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07542e-03 / 2
  ADC_P0  : -7.95714e-03 ± 2.21941e-02
  ADC_P1  : 8.51604e-03 ± 5.52435e-04
  ADC_P2  : -6.15043e-06 ± 2.72363e-06
  CSA_Chi2/NDF : 1.38364e-04 / 2
  CSA_P0  : 6.04406e-02 ± 7.84575e-03
  CSA_P1  : 9.98659e-03 ± 5.91120e-04
  CSA_P2  : -4.88906e-05 ± 9.00206e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 23, 48, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 16, 21, 70, 72, 73, 98, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2208', '1.800', '0.1656', '1.800', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1725299438.085906]
VI_after__Init : ['1.201', '0.2208', '1.800', '0.1657', '1.800', '0.0761', '7.000', '0.7067', 1, 1, 1, 1, 1725299446.30132]
VI_at__the_End : ['1.201', '0.4915', '1.800', '0.1396', '1.800', '0.1141', '7.000', '0.7076', 1, 1, 1, 1, 1725299505.7856598]