TEST_NAME : Wafer
TEST_DATE : 24_09_02-19_57_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-011-13 | FUSED_ID : 6359364768391798973
  IC_TEMP :  -54.02 | VDDM : 1126.48 | AUX_INT :   -8.19 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40509e-03 / 2
  ADC_P0  : -8.18649e-03 ± 2.54641e-02
  ADC_P1  : 8.36784e-03 ± 6.37482e-04
  ADC_P2  : -5.05123e-06 ± 3.17071e-06
  CSA_Chi2/NDF : 1.57223e-04 / 2
  CSA_P0  : 6.06227e-02 ± 8.36334e-03
  CSA_P1  : 1.01549e-02 ± 6.30117e-04
  CSA_P2  : -5.03310e-05 ± 9.59594e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [13, 14, 31, 42, 77, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [54, 68, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4394', '1.800', '0.1509', '1.800', '0.0943', '7.000', '0.7072', 1, 1, 1, 1, 1725299824.0725098]
VI_after__Init : ['1.201', '0.4398', '1.800', '0.1509', '1.800', '0.0888', '7.000', '0.7071', 1, 1, 1, 1, 1725299832.8298054]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1396', '1.800', '0.1123', '7.000', '0.7077', 1, 1, 1, 1, 1725299899.6065445]