TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_01_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-014-13 | FUSED_ID : 6359364768391799021
  IC_TEMP :  -53.75 | VDDM : 1130.70 | AUX_INT :   -9.78 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60627e-03 / 2
  ADC_P0  : -9.77673e-03 ± 2.71563e-02
  ADC_P1  : 8.52388e-03 ± 6.66689e-04
  ADC_P2  : -6.43092e-06 ± 3.25095e-06
  CSA_Chi2/NDF : 1.05848e-04 / 2
  CSA_P0  : 5.78922e-02 ± 6.86220e-03
  CSA_P1  : 9.90711e-03 ± 5.17017e-04
  CSA_P2  : -4.71457e-05 ± 7.87356e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 53, 89, 111, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [19, 74, 77, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3125', '1.800', '0.1543', '1.800', '0.0908', '7.000', '0.7072', 1, 1, 1, 1, 1725300113.309969]
VI_after__Init : ['1.201', '0.3135', '1.800', '0.1540', '1.800', '0.0853', '7.000', '0.7072', 1, 1, 1, 1, 1725300121.2613652]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1373', '1.800', '0.1101', '7.000', '0.7082', 1, 1, 1, 1, 1725300186.6371868]