TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_13_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-021-10 | FUSED_ID : 6359364768391799130
  IC_TEMP :  -56.02 | VDDM : 1120.50 | AUX_INT :   -8.72 | CsaBias :   62.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36382e-03 / 2
  ADC_P0  : -8.71727e-03 ± 2.50392e-02
  ADC_P1  : 8.91218e-03 ± 6.55053e-04
  ADC_P2  : -6.40839e-06 ± 3.40394e-06
  CSA_Chi2/NDF : 1.41605e-04 / 2
  CSA_P0  : 6.15671e-02 ± 7.93711e-03
  CSA_P1  : 1.01546e-02 ± 5.98004e-04
  CSA_P2  : -5.02861e-05 ± 9.10689e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 49, 54, 59, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 60, 72, 101, 104, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2701', '1.800', '0.1629', '1.800', '0.1002', '7.000', '0.7078', 1, 1, 1, 1, 1725300787.6837335]
VI_after__Init : ['1.201', '0.2699', '1.800', '0.1627', '1.801', '0.0947', '7.000', '0.7076', 1, 1, 1, 1, 1725300795.7961729]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1420', '1.805', '0.1156', '7.000', '0.7082', 1, 1, 1, 1, 1725300862.0429993]