TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_14_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-022-10 | FUSED_ID : 6359364768391799146
  IC_TEMP :  -53.65 | VDDM : 1126.72 | AUX_INT :   -8.55 | CsaBias :   70.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17707e-03 / 2
  ADC_P0  : -8.55189e-03 ± 2.32246e-02
  ADC_P1  : 8.88328e-03 ± 6.01908e-04
  ADC_P2  : -6.60370e-06 ± 3.09698e-06
  CSA_Chi2/NDF : 1.46870e-04 / 2
  CSA_P0  : 6.18134e-02 ± 8.08330e-03
  CSA_P1  : 1.01032e-02 ± 6.09018e-04
  CSA_P2  : -4.91422e-05 ± 9.27462e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 88, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [12, 25, 44, 81, 85, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3884', '1.800', '0.1585', '1.799', '0.0924', '7.000', '0.7077', 1, 1, 1, 1, 1725300883.4524105]
VI_after__Init : ['1.201', '0.3885', '1.800', '0.1586', '1.801', '0.0869', '7.000', '0.7076', 1, 1, 1, 1, 1725300891.5777414]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1401', '1.800', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1725300958.406576]