TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_22_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-010-027-10 | FUSED_ID : 6359364768391799226
  IC_TEMP :  -52.17 | VDDM : 1137.23 | AUX_INT :  -87.49 | CsaBias :   -0.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62396e-03 / 2
  ADC_P0  : -8.74937e-02 ± 3.16850e-02
  ADC_P1  : 9.70514e-03 ± 7.60786e-04
  ADC_P2  : -1.02689e-05 ± 3.60682e-06
  CSA_Chi2/NDF : 1.23471e-04 / 2
  CSA_P0  : 5.57411e-02 ± 7.41149e-03
  CSA_P1  : 9.99369e-03 ± 5.58402e-04
  CSA_P2  : -4.58099e-05 ± 8.50381e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 15, 16, 21, 29, 38, 39, 54, 61, 69, 86, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [34, 38, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2522', '1.800', '0.1467', '1.800', '0.0943', '7.000', '0.7070', 1, 1, 1, 1, 1725301364.0624928]
VI_after__Init : ['1.201', '0.2518', '1.800', '0.1467', '1.801', '0.0899', '7.000', '0.7070', 1, 1, 1, 1, 1725301372.0298316]
VI_at__the_End : ['1.201', '0.5001', '1.800', '0.1338', '1.808', '0.1102', '7.000', '0.7080', 1, 1, 1, 1, 1725301440.3206751]