TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_59_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-011-005-00 | FUSED_ID : 6359364768391802960
  IC_TEMP :  -54.90 | VDDM : 1127.37 | AUX_INT :  -18.65 | CsaBias :   69.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66507e-03 / 2
  ADC_P0  : -1.86519e-02 ± 2.82043e-02
  ADC_P1  : 8.85466e-03 ± 7.18085e-04
  ADC_P2  : -6.55900e-06 ± 3.63479e-06
  CSA_Chi2/NDF : 1.59081e-04 / 2
  CSA_P0  : 6.15132e-02 ± 8.41264e-03
  CSA_P1  : 1.02609e-02 ± 6.33831e-04
  CSA_P2  : -5.10461e-05 ± 9.65250e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [35, 55, 66, 71, 90, 93, 96, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [5, 6, 9, 23, 35, 37, 53, 57, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3150', '1.800', '0.1539', '1.799', '0.0912', '7.000', '0.7074', 1, 1, 1, 1, 1725303581.0841115]
VI_after__Init : ['1.201', '0.3151', '1.800', '0.1539', '1.799', '0.0855', '7.000', '0.7074', 1, 1, 1, 1, 1725303589.2655025]
VI_at__the_End : ['1.201', '0.5010', '1.800', '0.1415', '1.808', '0.1126', '7.000', '0.7085', 1, 1, 1, 1, 1725303650.427654]