TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_50_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-011-011-00 | FUSED_ID : 6359364768391803056
  IC_TEMP :  -60.47 | VDDM : 1130.48 | AUX_INT :   -7.80 | CsaBias :   71.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.91025e-04 / 2
  ADC_P0  : -7.80389e-03 ± 2.12619e-02
  ADC_P1  : 8.86316e-03 ± 5.42315e-04
  ADC_P2  : -7.30596e-06 ± 2.73128e-06
  CSA_Chi2/NDF : 1.38519e-04 / 2
  CSA_P0  : 5.87992e-02 ± 7.85014e-03
  CSA_P1  : 1.01864e-02 ± 5.91451e-04
  CSA_P2  : -5.22223e-05 ± 9.00710e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [8, 11, 18, 35, 47, 57, 91, 92, 98, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [26, 72, 73, 77, 90, 102, 111, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1461', '1.800', '0.1834', '1.800', '0.0847', '7.000', '0.7074', 1, 1, 1, 1, 1725303002.798836]
VI_after__Init : ['1.201', '0.1458', '1.800', '0.1821', '1.800', '0.0787', '7.000', '0.7073', 1, 1, 1, 1, 1725303010.9691067]
VI_at__the_End : ['1.201', '0.4882', '1.800', '0.1380', '1.803', '0.1147', '7.000', '0.7081', 1, 1, 1, 1, 1725303072.2044752]