TEST_NAME : Wafer
TEST_DATE : 24_09_02-20_32_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-011-022-07 | FUSED_ID : 6359364768391803239
  IC_TEMP :  -55.06 | VDDM : 1097.65 | AUX_INT :   -8.84 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36289e-03 / 2
  ADC_P0  : -8.83557e-03 ± 2.50043e-02
  ADC_P1  : 8.60346e-03 ± 6.24562e-04
  ADC_P2  : -6.38568e-06 ± 3.09374e-06
  CSA_Chi2/NDF : 1.36276e-04 / 2
  CSA_P0  : 5.89108e-02 ± 7.78631e-03
  CSA_P1  : 9.70271e-03 ± 5.86642e-04
  CSA_P2  : -4.53707e-05 ± 8.93387e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [23, 48, 65, 70, 73, 98, 103, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 10, 40, 42, 43, 56, 88, 102, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1771', '1.800', '0.1630', '1.800', '0.0927', '7.000', '0.7067', 1, 1, 1, 1, 1725301941.5851982]
VI_after__Init : ['1.201', '0.1771', '1.800', '0.1630', '1.800', '0.0873', '7.000', '0.7067', 1, 1, 1, 1, 1725301950.4065845]
VI_at__the_End : ['1.201', '0.4840', '1.800', '0.1366', '1.799', '0.1138', '7.000', '0.7075', 1, 1, 1, 1, 1725302017.6123881]