TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_10_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-005-08 | FUSED_ID : 6359364768391807064
  IC_TEMP :  -57.38 | VDDM : 1130.10 | AUX_INT :   -7.54 | CsaBias :   78.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33335e-04 / 2
  ADC_P0  : -7.54099e-03 ± 2.06506e-02
  ADC_P1  : 8.64389e-03 ± 5.20227e-04
  ADC_P2  : -6.46705e-06 ± 2.59341e-06
  CSA_Chi2/NDF : 1.69486e-04 / 2
  CSA_P0  : 6.07267e-02 ± 8.68339e-03
  CSA_P1  : 1.00190e-02 ± 6.54231e-04
  CSA_P2  : -4.86896e-05 ± 9.96316e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [5, 7, 8, 13, 19, 22, 25, 38, 42, 49, 61, 63, 89, 93, 95, 101, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [16, 28, 31, 43, 53, 64, 79, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2560', '1.800', '0.1406', '1.800', '0.0920', '7.000', '0.7073', 1, 1, 1, 1, 1725304256.397959]
VI_after__Init : ['1.201', '0.2560', '1.800', '0.1398', '1.799', '0.0861', '7.000', '0.7072', 1, 1, 1, 1, 1725304264.511346]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1422', '1.799', '0.1132', '7.000', '0.7082', 1, 1, 1, 1, 1725304331.2601619]