TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_20_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-011-08 | FUSED_ID : 6359364768391807160
  IC_TEMP :  -53.75 | VDDM : 1134.79 | AUX_INT :   -7.75 | CsaBias :   76.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00491e-03 / 2
  ADC_P0  : -7.75184e-03 ± 2.14843e-02
  ADC_P1  : 8.44558e-03 ± 5.41349e-04
  ADC_P2  : -5.21809e-06 ± 2.71256e-06
  CSA_Chi2/NDF : 1.30360e-04 / 2
  CSA_P0  : 6.22347e-02 ± 7.61542e-03
  CSA_P1  : 1.00298e-02 ± 5.73767e-04
  CSA_P2  : -4.71619e-05 ± 8.73779e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 2, 5, 8, 17, 19, 96, 113, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [16, 37, 59, 70, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3309', '1.800', '0.1576', '1.800', '0.0899', '7.000', '0.7070', 1, 1, 1, 1, 1725304835.0579252]
VI_after__Init : ['1.201', '0.3311', '1.800', '0.1575', '1.800', '0.0841', '7.000', '0.7069', 1, 1, 1, 1, 1725304843.191358]
VI_at__the_End : ['1.202', '0.5029', '1.800', '0.1435', '1.804', '0.1126', '7.000', '0.7076', 1, 1, 1, 1, 1725304907.2433338]