TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_25_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-014-08 | FUSED_ID : 6359364768391807208
  IC_TEMP :  -52.85 | VDDM : 1130.78 | AUX_INT :   -7.67 | CsaBias :   74.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01070e-03 / 2
  ADC_P0  : -7.67281e-03 ± 2.15318e-02
  ADC_P1  : 8.30912e-03 ± 5.29544e-04
  ADC_P2  : -5.39011e-06 ± 2.58481e-06
  CSA_Chi2/NDF : 1.09495e-04 / 2
  CSA_P0  : 6.04965e-02 ± 6.97943e-03
  CSA_P1  : 9.82757e-03 ± 5.25849e-04
  CSA_P2  : -4.60169e-05 ± 8.00806e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 9, 39, 46, 49, 56, 94, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 44, 95, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1682', '1.800', '0.1331', '1.800', '0.0831', '7.000', '0.7078', 1, 1, 1, 1, 1725305123.077667]
VI_after__Init : ['1.201', '0.1682', '1.799', '0.1332', '1.801', '0.0759', '7.000', '0.7069', 1, 1, 1, 1, 1725305131.9919257]
VI_at__the_End : ['1.201', '0.4959', '1.800', '0.1388', '1.806', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1725305198.4216912]