TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_33_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-019-15 | FUSED_ID : 6359364768391807295
  IC_TEMP :  -52.21 | VDDM : 1126.52 | AUX_INT :   -7.40 | CsaBias :   76.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.27347e-04 / 2
  CSA_P0  : 6.05587e-02 ± 7.52690e-03
  CSA_P1  : 9.83862e-03 ± 5.67098e-04
  CSA_P2  : -4.43975e-05 ± 8.63623e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [35, 73, 95, 109, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [30, 57, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3912', '1.800', '0.1334', '1.800', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1725305605.420072]
VI_after__Init : ['1.201', '0.3913', '1.800', '0.1334', '1.800', '0.0867', '7.000', '0.7069', 1, 1, 1, 1, 1725305613.5665405]
VI_at__the_End : ['1.201', '0.4971', '1.800', '0.1396', '1.800', '0.1117', '7.000', '0.7079', 1, 1, 1, 1, 1725305682.9615757]