TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_39_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-012-023-15 | FUSED_ID : 6359364768391807359
  IC_TEMP :  -54.01 | VDDM : 1129.53 | AUX_INT :   -8.47 | CsaBias :   65.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30963e-03 / 2
  ADC_P0  : -8.46566e-03 ± 2.45050e-02
  ADC_P1  : 8.27609e-03 ± 5.88714e-04
  ADC_P2  : -6.02715e-06 ± 2.79863e-06
  CSA_Chi2/NDF : 1.27552e-04 / 2
  CSA_P0  : 6.12176e-02 ± 7.53296e-03
  CSA_P1  : 9.86911e-03 ± 5.67554e-04
  CSA_P2  : -4.52505e-05 ± 8.64318e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [33, 69, 98, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 49, 62, 86, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2667', '1.799', '0.1634', '1.800', '0.0940', '7.000', '0.7081', 1, 1, 1, 1, 1725305991.106234]
VI_after__Init : ['1.201', '0.2668', '1.801', '0.1635', '1.800', '0.0873', '7.000', '0.7074', 1, 1, 1, 1, 1725305999.2466419]
VI_at__the_End : ['1.201', '0.4994', '1.800', '0.1401', '1.800', '0.1124', '7.000', '0.7080', 1, 1, 1, 1, 1725306066.4286795]