TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_20_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-006-05 | FUSED_ID : 6359364768391811173
  IC_TEMP :  -52.74 | VDDM : 1126.45 | AUX_INT :   -9.39 | CsaBias :   72.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34673e-03 / 2
  ADC_P0  : -9.38776e-03 ± 2.48541e-02
  ADC_P1  : 8.27724e-03 ± 5.99572e-04
  ADC_P2  : -5.57819e-06 ± 2.88421e-06
  CSA_Chi2/NDF : 1.56669e-04 / 2
  CSA_P0  : 5.73978e-02 ± 8.34860e-03
  CSA_P1  : 1.01562e-02 ± 6.29007e-04
  CSA_P2  : -4.99709e-05 ± 9.57903e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 20, 30, 47, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [13, 24, 29, 30, 32, 74, 91, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3086', '1.800', '0.1265', '1.800', '0.0888', '7.000', '0.7076', 1, 1, 1, 1, 1725308399.7107313]
VI_after__Init : ['1.201', '0.3088', '1.800', '0.1266', '1.800', '0.0814', '7.000', '0.7067', 1, 1, 1, 1, 1725308407.8500433]
VI_at__the_End : ['1.201', '0.4925', '1.800', '0.1368', '1.806', '0.1120', '7.000', '0.7072', 1, 1, 1, 1, 1725308467.7464056]