TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_18_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-007-05 | FUSED_ID : 6359364768391811189
  IC_TEMP :  -56.15 | VDDM : 1126.82 | AUX_INT :   -7.57 | CsaBias :   75.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.14712e-04 / 2
  ADC_P0  : -7.56984e-03 ± 2.04244e-02
  ADC_P1  : 8.33797e-03 ± 4.92087e-04
  ADC_P2  : -6.31050e-06 ± 2.34289e-06
  CSA_Chi2/NDF : 1.27356e-04 / 2
  CSA_P0  : 5.88944e-02 ± 7.52718e-03
  CSA_P1  : 9.67164e-03 ± 5.67118e-04
  CSA_P2  : -4.34479e-05 ± 8.63654e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 13, 16, 69, 73, 90, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 24, 45, 60, 74, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1864', '1.800', '0.1606', '1.800', '0.0870', '7.000', '0.7066', 1, 1, 1, 1, 1725308303.8472712]
VI_after__Init : ['1.201', '0.1863', '1.800', '0.1606', '1.802', '0.0815', '7.000', '0.7069', 1, 1, 1, 1, 1725308311.9416637]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1357', '1.803', '0.1117', '7.000', '0.7077', 1, 1, 1, 1, 1725308379.6503158]