TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_13_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-010-05 | FUSED_ID : 6359364768391811237
  IC_TEMP :  -49.16 | VDDM : 1130.16 | AUX_INT :   -5.39 | CsaBias :   60.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.63050e-04 / 2
  ADC_P0  : -5.39008e-03 ± 1.87237e-02
  ADC_P1  : 8.29472e-03 ± 4.72169e-04
  ADC_P2  : -4.82916e-06 ± 2.34979e-06
  CSA_Chi2/NDF : 1.21808e-04 / 2
  CSA_P0  : 6.08375e-02 ± 7.36138e-03
  CSA_P1  : 9.97064e-03 ± 5.54627e-04
  CSA_P2  : -4.61564e-05 ± 8.44631e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 16, 19, 33, 80, 83, 84, 89, 93, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [34, 52, 70, 89, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1688', '1.800', '0.1430', '1.799', '0.0803', '7.000', '0.7069', 1, 1, 1, 1, 1725308014.3531013]
VI_after__Init : ['1.201', '0.1687', '1.800', '0.1430', '1.800', '0.0744', '7.000', '0.7066', 1, 1, 1, 1, 1725308022.4285042]
VI_at__the_End : ['1.201', '0.5019', '1.800', '0.1412', '1.801', '0.1104', '7.000', '0.7076', 1, 1, 1, 1, 1725308082.435719]