TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_08_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-013-05 | FUSED_ID : 6359364768391811285
  IC_TEMP :  -52.13 | VDDM : 1121.65 | AUX_INT :   -6.93 | CsaBias :   68.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00033e-03 / 2
  ADC_P0  : -6.92582e-03 ± 2.14383e-02
  ADC_P1  : 8.42869e-03 ± 5.39516e-04
  ADC_P2  : -5.42701e-06 ± 2.68515e-06
  CSA_Chi2/NDF : 1.47243e-04 / 2
  CSA_P0  : 5.89270e-02 ± 8.09357e-03
  CSA_P1  : 9.98119e-03 ± 6.09792e-04
  CSA_P2  : -4.87943e-05 ± 9.28641e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [2, 42, 67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 14, 18, 85, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1815', '1.800', '0.1139', '1.800', '0.0815', '7.000', '0.7070', 1, 1, 1, 1, 1725307724.9943712]
VI_after__Init : ['1.201', '0.1813', '1.799', '0.1139', '1.800', '0.0758', '7.000', '0.7069', 1, 1, 1, 1, 1725307733.9096859]
VI_at__the_End : ['1.201', '0.4898', '1.800', '0.1375', '1.801', '0.1119', '7.000', '0.7079', 1, 1, 1, 1, 1725307803.2331214]