TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_57_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-020-02 | FUSED_ID : 6359364768391811394
  IC_TEMP :  -58.81 | VDDM : 1122.38 | AUX_INT :  -17.41 | CsaBias :   81.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30276e-03 / 2
  ADC_P0  : -1.74138e-02 ± 2.48716e-02
  ADC_P1  : 8.28854e-03 ± 5.93071e-04
  ADC_P2  : -5.76147e-06 ± 2.81137e-06
  CSA_Chi2/NDF : 1.67196e-04 / 2
  CSA_P0  : 5.83436e-02 ± 8.62451e-03
  CSA_P1  : 1.01677e-02 ± 6.49795e-04
  CSA_P2  : -5.27452e-05 ± 9.89561e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 29, 33, 49, 54, 79, 81, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [71, 79, 114, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3772', '1.800', '0.1520', '1.800', '0.0956', '7.000', '0.7077', 1, 1, 1, 1, 1725307051.6775718]
VI_after__Init : ['1.201', '0.3769', '1.800', '0.1523', '1.800', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1725307059.7159073]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1380', '1.800', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1725307124.4280055]