TEST_NAME : Wafer
TEST_DATE : 24_09_02-21_55_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-013-021-02 | FUSED_ID : 6359364768391811410
  IC_TEMP :  -47.58 | VDDM : 1128.95 | AUX_INT :   -6.93 | CsaBias :   81.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07840e-03 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 1.38525e-04 / 2
  CSA_P0  : 5.94449e-02 ± 7.85029e-03
  CSA_P1  : 9.87580e-03 ± 5.91463e-04
  CSA_P2  : -4.46944e-05 ± 9.00728e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 13, 23, 46, 51, 104, 113, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 45, 66, 85, 103, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3295', '1.800', '0.1815', '1.800', '0.0940', '7.000', '0.7086', 1, 1, 1, 1, 1725306955.2158642]
VI_after__Init : ['1.201', '0.3298', '1.800', '0.1815', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1725306963.2792895]
VI_at__the_End : ['1.201', '0.5018', '1.799', '0.1368', '1.800', '0.1115', '7.000', '0.7083', 1, 1, 1, 1, 1725307030.7271366]