TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_29_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-005-11 | FUSED_ID : 6359364768391815259
  IC_TEMP :  -47.15 | VDDM : 1125.67 | AUX_INT :   -9.01 | CsaBias :   81.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45128e-03 / 2
  ADC_P0  : -9.00552e-03 ± 2.58502e-02
  ADC_P1  : 8.27605e-03 ± 6.30452e-04
  ADC_P2  : -5.33594e-06 ± 3.05825e-06
  CSA_Chi2/NDF : 1.01725e-04 / 2
  CSA_P0  : 5.72339e-02 ± 6.72722e-03
  CSA_P1  : 9.51734e-03 ± 5.06847e-04
  CSA_P2  : -4.03583e-05 ± 7.71868e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 7, 26, 52, 71, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [50, 52, 56, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1959', '1.800', '0.1606', '1.800', '0.0829', '7.000', '0.7073', 1, 1, 1, 1, 1725308977.0037055]
VI_after__Init : ['1.201', '0.1958', '1.800', '0.1606', '1.800', '0.0772', '7.000', '0.7072', 1, 1, 1, 1, 1725308985.6890562]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1356', '1.809', '0.1083', '7.000', '0.7083', 1, 1, 1, 1, 1725309053.9777951]