TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_32_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-007-11 | FUSED_ID : 6359364768391815291
  IC_TEMP :  -48.81 | VDDM : 1129.55 | AUX_INT :   -8.16 | CsaBias :   82.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16880e-03 / 2
  ADC_P0  : -8.15642e-03 ± 2.31968e-02
  ADC_P1  : 8.32672e-03 ± 5.77504e-04
  ADC_P2  : -4.94657e-06 ± 2.86169e-06
  CSA_Chi2/NDF : 1.26088e-04 / 2
  CSA_P0  : 5.99989e-02 ± 7.48962e-03
  CSA_P1  : 1.00252e-02 ± 5.64289e-04
  CSA_P2  : -4.68691e-05 ± 8.59345e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [16, 25, 27, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 35, 40, 71, 85, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3781', '1.800', '0.1760', '1.800', '0.0935', '7.000', '0.7072', 1, 1, 1, 1, 1725309169.6806107]
VI_after__Init : ['1.201', '0.3782', '1.800', '0.1761', '1.800', '0.0877', '7.000', '0.7075', 1, 1, 1, 1, 1725309178.3909972]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1406', '1.804', '0.1105', '7.000', '0.7082', 1, 1, 1, 1, 1725309244.6269202]