TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_34_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-008-11 | FUSED_ID : 6359364768391815307
  IC_TEMP :  -47.61 | VDDM : 1132.97 | AUX_INT :   -6.26 | CsaBias :   68.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03887e-03 / 2
  ADC_P0  : -6.26038e-03 ± 2.18573e-02
  ADC_P1  : 8.39818e-03 ± 5.51205e-04
  ADC_P2  : -5.35530e-06 ± 2.74040e-06
  CSA_Chi2/NDF : 9.22196e-05 / 2
  CSA_P0  : 5.80578e-02 ± 6.40522e-03
  CSA_P1  : 9.68508e-03 ± 4.82587e-04
  CSA_P2  : -4.20120e-05 ± 7.34923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [56, 70, 96, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [17, 22, 25, 93, 97, 103, 106, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3302', '1.800', '0.1398', '1.800', '0.0895', '7.000', '0.7076', 1, 1, 1, 1, 1725309266.242274]
VI_after__Init : ['1.202', '0.3304', '1.800', '0.1397', '1.800', '0.0840', '7.000', '0.7074', 1, 1, 1, 1, 1725309274.2646434]
VI_at__the_End : ['1.201', '0.4981', '1.800', '0.1396', '1.800', '0.1092', '7.000', '0.7082', 1, 1, 1, 1, 1725309333.4470317]