TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_45_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-015-11 | FUSED_ID : 6359364768391815419
  IC_TEMP :  -47.73 | VDDM : 1134.05 | AUX_INT :   -8.77 | CsaBias :   78.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25659e-03 / 2
  ADC_P0  : -8.76765e-03 ± 2.39952e-02
  ADC_P1  : 7.97773e-03 ± 5.55779e-04
  ADC_P2  : -5.46265e-06 ± 2.55527e-06
  CSA_Chi2/NDF : 9.41369e-05 / 2
  CSA_P0  : 6.01715e-02 ± 6.47146e-03
  CSA_P1  : 9.52410e-03 ± 4.87578e-04
  CSA_P2  : -3.92546e-05 ± 7.42523e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [57, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 56, 69, 79, 85, 104, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1366', '1.800', '0.1158', '1.800', '0.0842', '7.000', '0.7083', 1, 1, 1, 1, 1725309940.7065027]
VI_after__Init : ['1.201', '0.1366', '1.800', '0.1158', '1.801', '0.0769', '7.000', '0.7076', 1, 1, 1, 1, 1725309948.7198818]
VI_at__the_End : ['1.201', '0.5009', '1.800', '0.1372', '1.800', '0.1090', '7.000', '0.7083', 1, 1, 1, 1, 1725310008.4681654]