TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_52_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-019-12 | FUSED_ID : 6359364768391815484
  IC_TEMP :  -51.16 | VDDM : 1117.11 | AUX_INT :   -9.26 | CsaBias :   74.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48502e-03 / 2
  ADC_P0  : -9.26042e-03 ± 2.61391e-02
  ADC_P1  : 8.47846e-03 ± 6.47277e-04
  ADC_P2  : -5.86388e-06 ± 3.18914e-06
  CSA_Chi2/NDF : 1.20240e-04 / 2
  CSA_P0  : 5.90948e-02 ± 7.31385e-03
  CSA_P1  : 9.70255e-03 ± 5.51046e-04
  CSA_P2  : -4.42182e-05 ± 8.39178e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [37, 45, 57, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [15, 94, 116, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3742', '1.800', '0.1429', '1.799', '0.0911', '7.000', '0.7071', 1, 1, 1, 1, 1725310325.201506]
VI_after__Init : ['1.201', '0.3741', '1.800', '0.1428', '1.800', '0.0853', '7.000', '0.7072', 1, 1, 1, 1, 1725310334.0078485]
VI_at__the_End : ['1.202', '0.4910', '1.800', '0.1388', '1.800', '0.1107', '7.000', '0.7079', 1, 1, 1, 1, 1725310393.5722165]