TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_53_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-020-12 | FUSED_ID : 6359364768391815500
  IC_TEMP :  -53.23 | VDDM : 1112.63 | AUX_INT :   -9.93 | CsaBias :   79.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72819e-03 / 2
  ADC_P0  : -9.93191e-03 ± 2.82190e-02
  ADC_P1  : 8.20892e-03 ± 6.76685e-04
  ADC_P2  : -5.41891e-06 ± 3.23248e-06
  CSA_Chi2/NDF : 1.08935e-04 / 2
  CSA_P0  : 5.93682e-02 ± 6.96157e-03
  CSA_P1  : 9.80935e-03 ± 5.24504e-04
  CSA_P2  : -4.55486e-05 ± 7.98757e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [30, 39, 46, 60, 71, 85, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 9, 15, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2510', '1.800', '0.1596', '1.800', '0.0870', '7.000', '0.7073', 1, 1, 1, 1, 1725310422.045043]
VI_after__Init : ['1.201', '0.2510', '1.800', '0.1595', '1.800', '0.0812', '7.000', '0.7072', 1, 1, 1, 1, 1725310430.7744095]
VI_at__the_End : ['1.202', '0.4928', '1.800', '0.1366', '1.800', '0.1090', '7.000', '0.7078', 1, 1, 1, 1, 1725310498.1150544]