TEST_NAME : Wafer
TEST_DATE : 24_09_02-22_55_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-021-12 | FUSED_ID : 6359364768391815516
  IC_TEMP :  -55.13 | VDDM : 1119.09 | AUX_INT :   -8.08 | CsaBias :   73.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17911e-03 / 2
  ADC_P0  : -8.07604e-03 ± 2.32833e-02
  ADC_P1  : 8.19480e-03 ± 5.65933e-04
  ADC_P2  : -5.12639e-06 ± 2.73263e-06
  CSA_Chi2/NDF : 1.71946e-04 / 2
  CSA_P0  : 5.90203e-02 ± 8.74619e-03
  CSA_P1  : 1.02212e-02 ± 6.58962e-04
  CSA_P2  : -5.12080e-05 ± 1.00352e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [2, 33, 50, 54, 56, 75, 77, 88, 103, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 10, 54, 78, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3327', '1.800', '0.1392', '1.799', '0.0877', '7.000', '0.7073', 1, 1, 1, 1, 1725310518.1835132]
VI_after__Init : ['1.202', '0.3289', '1.800', '0.1396', '1.801', '0.0841', '7.000', '0.7072', 1, 1, 1, 1, 1725310526.2799137]
VI_at__the_End : ['1.201', '0.4929', '1.800', '0.1382', '1.803', '0.1128', '7.000', '0.7078', 1, 1, 1, 1, 1725310587.6841588]