TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_01_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-025-12 | FUSED_ID : 6359364768391815580
  IC_TEMP :  -49.04 | VDDM : 1125.65 | AUX_INT :   -7.90 | CsaBias :   75.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04611e-03 / 2
  ADC_P0  : -7.90225e-03 ± 2.18823e-02
  ADC_P1  : 8.37664e-03 ± 5.33522e-04
  ADC_P2  : -6.04637e-06 ± 2.57770e-06
  CSA_Chi2/NDF : 1.20330e-04 / 2
  CSA_P0  : 5.82323e-02 ± 7.31660e-03
  CSA_P1  : 9.70741e-03 ± 5.51253e-04
  CSA_P2  : -4.31934e-05 ± 8.39494e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [16, 26, 72, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 24, 43, 75, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2002', '1.800', '0.1323', '1.800', '0.0832', '7.000', '0.7069', 1, 1, 1, 1, 1725310905.073462]
VI_after__Init : ['1.202', '0.2004', '1.800', '0.1322', '1.800', '0.0772', '7.000', '0.7066', 1, 1, 1, 1, 1725310913.181941]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1345', '1.800', '0.1092', '7.000', '0.7076', 1, 1, 1, 1, 1725310972.707272]