TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_03_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-014-026-12 | FUSED_ID : 6359364768391815596
  IC_TEMP :  -52.98 | VDDM : 1131.13 | AUX_INT :   -7.78 | CsaBias :   91.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01945e-03 / 2
  ADC_P0  : -7.77925e-03 ± 2.16248e-02
  ADC_P1  : 8.31409e-03 ± 5.31832e-04
  ADC_P2  : -5.40327e-06 ± 2.59598e-06
  CSA_Chi2/NDF : 1.16572e-04 / 2
  CSA_P0  : 5.92365e-02 ± 7.20143e-03
  CSA_P1  : 9.77236e-03 ± 5.42576e-04
  CSA_P2  : -4.23789e-05 ± 8.26278e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [39, 40, 60, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [7, 19, 23, 29, 38, 39, 51, 56, 100, 102, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2565', '1.800', '0.1394', '1.800', '0.0857', '7.000', '0.7069', 1, 1, 1, 1, 1725311001.9809918]
VI_after__Init : ['1.202', '0.2567', '1.800', '0.1393', '1.800', '0.0800', '7.000', '0.7066', 1, 1, 1, 1, 1725311010.0953493]
VI_at__the_End : ['1.201', '0.5029', '1.800', '0.1367', '1.800', '0.1091', '7.000', '0.7077', 1, 1, 1, 1, 1725311070.2696717]