TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_36_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-005-06 | FUSED_ID : 6359364768391819350
  IC_TEMP :  -55.51 | VDDM : 1132.01 | AUX_INT :   -9.99 | CsaBias :   75.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62533e-03 / 2
  ADC_P0  : -9.99024e-03 ± 2.73440e-02
  ADC_P1  : 8.65814e-03 ± 6.89935e-04
  ADC_P2  : -6.05056e-06 ± 3.47345e-06
  CSA_Chi2/NDF : 1.46949e-04 / 2
  CSA_P0  : 5.78192e-02 ± 8.08549e-03
  CSA_P1  : 9.94582e-03 ± 6.09183e-04
  CSA_P2  : -4.68928e-05 ± 9.27714e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [21, 48, 60, 71, 76, 77, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 22, 84, 85, 116, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3687', '1.800', '0.1348', '1.800', '0.0925', '7.000', '0.7077', 1, 1, 1, 1, 1725313019.0017672]
VI_after__Init : ['1.201', '0.3687', '1.800', '0.1348', '1.800', '0.0866', '7.000', '0.7074', 1, 1, 1, 1, 1725313027.9590847]
VI_at__the_End : ['1.201', '0.4956', '1.800', '0.1381', '1.800', '0.1123', '7.000', '0.7084', 1, 1, 1, 1, 1725313084.381788]